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Enhanced photo-response of WS 2 photodetectors through interfacial defect engineering using TiO 2 interlayer
Pak, Yusin, Park, Woojin, Alaal, Naresh, Kumaresan, Yogeenth, Aravindh, S. Assa, Mitra, Somak, Xin, Bin, Min, Jung-Wook, Kim, Hyeonghun, Lim, Namsoo, Cho, Byungjin, Jung, Gun Young, Hussain, MuhammadLangue:
english
Journal:
ACS Applied Electronic Materials
DOI:
10.1021/acsaelm.0c00011
Date:
February, 2020
Fichier:
PDF, 2.19 MB
english, 2020