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Investigation of structural and electronic properties of doped ceria Ce1-xMxO2 (M=Hf,Ti,Ba,Mg,Nb,Vx=0.25%) for ReRAM applications: A first principles study
Khera, Ejaz Ahmad, Ullah, Hafeez, Hussain, Fayyaz, Imran, Muhammad, Khalil, R.M. Arif, Sattar, M. Atif, Rana, Anwar Manzoor, Mahata, Chandreswar, Kim, SungjunVolume:
119
Langue:
english
Journal:
Physica E: Low-dimensional Systems and Nanostructures
DOI:
10.1016/j.physe.2020.114025
Date:
May, 2020
Fichier:
PDF, 1.85 MB
english, 2020