Characterization of irradiated p-type silicon detectors for TCAD surface radiation damage model validation
Morozzi, A., Moscatelli, F., Lombardi, G., Bilei, G.M., Hinger, V., Bergauer, T., Passeri, D.Volume:
15
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/15/01/C01029
Date:
January, 2020
Fichier:
PDF, 1.82 MB
2020