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Design of protected circuit models for nonlinear dielectric conductivity measurement system under high-energy impulse breakdown conditions
Liu, Chenyang, Yousif, Muhammad, Hu, Siquan, Han, Kun, Yao, Wei, Liu, YangVolume:
9
Journal:
AIP Advances
DOI:
10.1063/1.5110933
Date:
October, 2019
Fichier:
PDF, 2.18 MB
2019