AIP Conference Proceedings [AIP The fifth international workshop on stress induced phenomena in metallization - Stuttgart (Germany) (23-25 June 1999)] - Direct measurement of nucleation times and growth rates of electromigration induced voids
Doan, Jonathan C., Bravman, John C., Flinn, Paul A., Marieb, Thomas N.Année:
1999
DOI:
10.1063/1.59903
Fichier:
PDF, 886 KB
1999