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Monolayer Semiconductors: Scanning Probe Lithography Patterning of Monolayer Semiconductors and Application in Quantifying Edge Recombination (Adv. Mater. 48/2019)
Zhao, Peida, Wang, Ruixuan, Lien, Der‐Hsien, Zhao, Yingbo, Kim, Hyungjin, Cho, Joy, Ahn, Geun Ho, Javey, AliVolume:
31
Journal:
Advanced Materials
DOI:
10.1002/adma.201970340
Date:
November, 2019
Fichier:
PDF, 2.08 MB
2019