Switched-current circuits test using pseudo-random method
Guo Jierong, He Yigang, Tang Shengxue, Li Hongmin, Liu Meirong, Liu HuiVolume:
52
Langue:
english
Pages:
9
DOI:
10.1007/s10470-007-9098-9
Date:
August, 2007
Fichier:
PDF, 608 KB
english, 2007