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[IEEE 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - Las Vegas, NV, USA (2019.5.28-2019.5.31)] 2019 IEEE 69th Electronic Components and Technology Conference (ECTC) - Reliability of Micro-Alloyed SnAgCu Based Solder Interconnections for Various Harsh Applications
Su, Sinan, John Akkara, Francy, Raj, Anto, Zhao, Cong, Gordon, Seth, Sridhar, Sharath, Thirugnanasambandam, Sivasubramanian, Hamasha, Sa'd, Suhling, Jeffery, Evans, JohnAnnée:
2019
Langue:
english
DOI:
10.1109/ECTC.2019.00318
Fichier:
PDF, 709 KB
english, 2019