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Resistive switching characteristics and mechanisms in silicon oxide memory devices
Chang, Yao-Feng, Fowler, Burt, Chen, Ying-Chen, Zhou, Fei, Wu, Xiaohan, Chen, Yen-Ting, Wang, Yanzhen, Xue, Fei, Lee, Jack C.Volume:
1
Journal:
Physical Sciences Reviews
DOI:
10.1515/psr-2016-0011
Date:
May, 2016
Fichier:
PDF, 2.98 MB
2016