Stability of pentacene-based top gate thin film transistor with thick parylene as dielectric under humid environment
Diallo, Abdou Karim, Seck, Mané, Ly, El Hadji Babacar, Erouel, Mohsen, Ndiaye, DieneVolume:
103
Langue:
english
Journal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113510
Date:
December, 2019
Fichier:
PDF, 763 KB
english, 2019