Radiated EMI evolution of power SiC MOSFET in a boost converter after short-circuit aging tests
Douzi, Shawki, Kadi, Moncef, Boulzazen, Habib, Tlig, Mohamed, Ben Hadj Slama, JaleleddineJournal:
Microelectronics Reliability
DOI:
10.1016/j.microrel.2019.113398
Date:
September, 2019
Fichier:
PDF, 1.25 MB
2019
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