[IEEE 2019 IEEE/MTT-S International Microwave Symposium - IMS 2019 - Boston, MA, USA (2019.6.2-2019.6.7)] 2019 IEEE MTT-S International Microwave Symposium (IMS) - Analysis of the Baseband Termination of High Power RF Transistors
Ladhani, Hussain, Jones, Jeffrey, Stevenson Kenney, J.Année:
2019
Langue:
english
DOI:
10.1109/MWSYM.2019.8700902
Fichier:
PDF, 962 KB
english, 2019