Parasitic Suppression in 2D Smart Power ICs Using Deep Trench Isolation: A Simulation Study
Abouelatta, Mohamed, Salem, Marwa S., Shaker, Ahmed, Elbanna, Mohamed, Zekry, Abdelhalim, Gontrand, ChristianLangue:
english
Journal:
National Academy Science Letters
DOI:
10.1007/s40009-019-00830-0
Date:
September, 2019
Fichier:
PDF, 541 KB
english, 2019