Metallic contact induced van der Waals gap in MoS2 FET
Kim, Changsik, Lee, Kwang Young, Moon, Inyong, Issarapanacheewin, Sudarat, Yoo, Won JongAnnée:
2019
Langue:
english
Journal:
Nanoscale
DOI:
10.1039/c9nr04567h
Fichier:
PDF, 2.19 MB
english, 2019