[IEEE 2019 International Conference on System Science and Engineering (ICSSE) - Dong Hoi, Vietnam (2019.7.20-2019.7.21)] 2019 International Conference on System Science and Engineering (ICSSE) - Detection and Classification Defects on Exported Banana Leaves by Computer Vision
Dat, Duong Tan, Dao Xuan Hai, Nguyen, Thinh, Nguyen TruongAnnée:
2019
Langue:
english
DOI:
10.1109/ICSSE.2019.8823097
Fichier:
PDF, 570 KB
english, 2019