
[IEEE 2018 Nanotechnology for Instrumentation and Measurement (NANOfIM) - Mexico City, Mexico (2018.11.7-2018.11.8)] 2018 Nanotechnology for Instrumentation and Measurement (NANOfIM) - Reliability and Metrology Features for Manufacturing Process of Nanoelements for Geo-Environmental Protection
Blois, L., Lay-Ekuakille, A.Année:
2018
Langue:
english
DOI:
10.1109/NANOFIM.2018.8688605
Fichier:
PDF, 426 KB
english, 2018