[IEEE 2017 IEEE 44th Photovoltaic Specialists Conference (PVSC) - Washington, DC (2017.6.25-2017.6.30)] 2017 IEEE 44th Photovoltaic Specialist Conference (PVSC) - Investigation of InP defect characteristics grown using novel TF-VLS technique
Chikhalkar, Abhinav, Fischer, Alec, Hettick, Mark, Javey, Ali, King, Richard R.Année:
2017
Langue:
english
DOI:
10.1109/pvsc.2017.8366511
Fichier:
PDF, 556 KB
english, 2017