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[IEEE 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Saratoga Springs, NY, USA (2019.5.6-2019.5.9)] 2019 30th Annual SEMI Advanced Semiconductor Manufacturing Conference (ASMC) - Convergence towards large perimeter overlay Run-to-Run using multivariate APC system
Duclaux, Benjamin, Pelletier, Alice, De-Caunes, Jean, Perrier, Robin, Babaud, Laurene, Gatefait, Maxime, Fagart, Olivier, Thivolle, Nicolas, Guerabsi, Mathieu, Chapon, Jean-Damien, Perrin, Bruno, MongAnnée:
2019
Langue:
english
DOI:
10.1109/asmc.2019.8791771
Fichier:
PDF, 1.20 MB
english, 2019