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[IEEE 2019 IEEE 28th International Symposium on Industrial Electronics (ISIE) - Vancouver, BC, Canada (2019.6.12-2019.6.14)] 2019 IEEE 28th International Symposium on Industrial Electronics (ISIE) - Reliability-Enhanced High-Level Synthesis using Memory Profiling and Fault Injection
Fibich, Christian, Horauer, Martin, Obermaisser, RomanAnnée:
2019
Langue:
english
DOI:
10.1109/ISIE.2019.8781158
Fichier:
PDF, 389 KB
english, 2019