A Forward Modeling Approach to High-Reliability Grain Mapping by Laboratory Diffraction Contrast Tomography (LabDCT)
Niverty, Sridhar, Sun, Jun, Williams, Jason, Bachmann, Florian, Gueninchault, Nicolas, Lauridsen, Erik, Chawla, NikhileshVolume:
71
Langue:
english
Journal:
JOM
DOI:
10.1007/s11837-019-03538-0
Date:
August, 2019
Fichier:
PDF, 2.75 MB
english, 2019