[IEEE 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) - Shanghai, China (2019.5.19-2019.5.23)] 2019 31st International Symposium on Power Semiconductor Devices and ICs (ISPSD) - A Total Ionizing Dose Detecting Circuit Based on Off-state Leakage Current of NLDMOS in Power IC
Luo, Ping, Ling, Rongxun, Zhou, Xiao, Jiang, Pengkai, Wu, YucaoAnnée:
2019
DOI:
10.1109/ISPSD.2019.8757653
Fichier:
PDF, 879 KB
2019