Optical Characterization of Non-Stoichiometric Silicon Nitride Films Exhibiting Combined Defects
Vohánka, Jiří, Ohlídal, Ivan, Ohlídal, Miloslav, Šustek, Štěpán, Čermák, Martin, Šulc, Václav, Vašina, Petr, Ženíšek, Jaroslav, Franta, DanielVolume:
9
Journal:
Coatings
DOI:
10.3390/coatings9070416
Date:
June, 2019
Fichier:
PDF, 1.81 MB
2019