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An Accurate Calorimetric Loss Measurement Method for SiC MOSFETs
Anurag, Anup, Acharya, Sayan, Bhattacharya, SubhashishAnnée:
2019
Langue:
english
Journal:
IEEE Journal of Emerging and Selected Topics in Power Electronics
DOI:
10.1109/JESTPE.2019.2920935
Fichier:
PDF, 15.02 MB
english, 2019