[IEEE 2018 IEEE MTT-S Latin America Microwave Conference (LAMC) - Arequipa, Peru (2018.12.12-2018.12.14)] 2018 IEEE MTT-S Latin America Microwave Conference (LAMC 2018) - Detecting Critical Resonances in Microwave Amplifiers through Noise Simulations
Collantes, J.M., Otegi, N., Anakabe, A., Mori, L., Barcenilla, A., Gonzalez-Perez, J.M.Année:
2018
Langue:
english
DOI:
10.1109/LAMC.2018.8699028
Fichier:
PDF, 965 KB
english, 2018