Relating microstructure to defect behavior in AA6061 using a combined computational and multiscale electron microscopy approach
Yoo, Yung Suk Jeremy, Lim, Hojun, Emery, John, Kacher, JoshJournal:
Acta Materialia
DOI:
10.1016/j.actamat.2019.05.033
Date:
May, 2019
Fichier:
PDF, 6.78 MB
2019
File converter
Plus de résultats de recherche
More benefits 
