High -spatial-resolution X-ray Inspection by Pixelated Scintillator
Miyao, Sho, Tanino, Takahiro, Shigeta, KazukiVolume:
11
Année:
2018
Langue:
english
Journal:
Transactions of The Japan Institute of Electronics Packaging
DOI:
10.5104/jiepeng.11.e18-011-1
Fichier:
PDF, 2.40 MB
english, 2018