Study on Dislocation Annihilation Mechanism of the High-Quality GaN Grown on Sputtered AlN/PSS and Its Application in Green Light-Emitting Diodes
Peng, Ruoshi, Meng, Xijun, Xu, Shengrui, Zhang, Jincheng, Li, Peixian, Huang, Jun, Du, Jinjuan, Zhao, Ying, Fan, Xiaomeng, Hao, YueAnnée:
2019
Langue:
english
Journal:
IEEE Transactions on Electron Devices
DOI:
10.1109/TED.2019.2904110
Fichier:
PDF, 1.98 MB
english, 2019
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