Classification of single and double-gate nanoscale MOSFET with different dielectrics from electrical characteristics using soft computing techniques
Deyasi, Arpan, Mukherjee, Soumen, Bhattacharjee, Arup Kumar, Sarkar, AngsumanLangue:
english
Journal:
International Journal of Information Technology
DOI:
10.1007/s41870-019-00301-1
Date:
April, 2019
Fichier:
PDF, 1.93 MB
english, 2019