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Detection of interfacial charge transfer in MoS2/PbI2 heterostructures via Kelvin probe force microscope
Ding, Simin, Xiao, Xuling, Liu, Shuhua, Wu, Jie, Huang, Zongyu, Qi, Xiang, Li, JunVolume:
125
Langue:
english
Journal:
Applied Physics A
DOI:
10.1007/s00339-019-2578-9
Date:
May, 2019
Fichier:
PDF, 1.55 MB
english, 2019