
[IEEE 2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Saint Petersburg and Moscow, Russia (2019.1.28-2019.1.31)] 2019 IEEE Conference of Russian Young Researchers in Electrical and Electronic Engineering (EIConRus) - Radar Absorption Measurement of the Limited Surface Area Thin Films
Sokolov, Maksim, Omelianchyk, Elena, Ivanov, MikhailAnnée:
2019
Langue:
english
DOI:
10.1109/EIConRus.2019.8656692
Fichier:
PDF, 321 KB
english, 2019