[IEEE 2018 IEEE International Conference on Advanced Manufacturing (ICAM) - Yunlin (2018.11.16-2018.11.18)] 2018 IEEE International Conference on Advanced Manufacturing (ICAM) - Robust the ESD Reliability by Drain-side Super-junctions for the UHV Circular nLDMOS
Chen, Shen-Li, Wu, Pei-Lin, Jhou, Yu-Lin, Lin, Po-Lin, Fan, Sheng-KaiAnnée:
2018
Langue:
english
DOI:
10.1109/AMCON.2018.8614954
Fichier:
PDF, 358 KB
english, 2018