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Electron Beam-Induced Carbon Erosion and the Impact on Electron Probe Microanalysis
Matthews, Mike B., Kearns, Stuart L., Buse, BenLangue:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/S1431927618015398
Date:
November, 2018
Fichier:
PDF, 1.78 MB
english, 2018