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Towards defining a simplified procedure for COTS system-on-chip TID testing
Di Mascio, Stefano, Menicucci, Alessandra, Furano, Gianluca, Szewczyk, Tomasz, Campajola, Luigi, Di Capua, Francesco, Lucaroni, Andrea, Ottavi, MarcoVolume:
50
Langue:
english
Journal:
Nuclear Engineering and Technology
DOI:
10.1016/j.net.2018.07.010
Date:
December, 2018
Fichier:
PDF, 2.72 MB
english, 2018