[IEEE 2018 IEEE International Semiconductor Laser Conference (ISLC) - Santa Fe, NM (2018.9.16-2018.9.19)] 2018 IEEE International Semiconductor Laser Conference (ISLC) - Beam Quality Factor Analysis for Coherently-Coupled Vertically-Emitting Laser Arrays
Raftery, James J., Groen, Joshua B., Ingold, Kirk A.Année:
2018
Langue:
english
DOI:
10.1109/ISLC.2018.8516234
Fichier:
PDF, 293 KB
english, 2018