[IEEE 2018 IEEE East-West Design & Test Symposium (EWDTS) - Kazan (2018.9.14-2018.9.17)] 2018 IEEE East-West Design & Test Symposium (EWDTS) - The Technique of Fast Power Analysis for FinFET Standard Cells
Korshunov, A. V., Ilin, S.A.Année:
2018
Langue:
english
DOI:
10.1109/EWDTS.2018.8524810
Fichier:
PDF, 304 KB
english, 2018