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Athermal recrystallization behavior of (Sn) solid-solution at an intermetallic-free Cu/Sn interface induced by room temperature electromigration
Liang, Chien-Lung, Lin, Kwang-LungVolume:
236
Langue:
english
Journal:
Materials Letters
DOI:
10.1016/j.matlet.2018.11.034
Date:
February, 2019
Fichier:
PDF, 1.95 MB
english, 2019