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[IEEE 2018 76th Device Research Conference (DRC) - Santa Barbara, CA, USA (2018.6.24-2018.6.27)] 2018 76th Device Research Conference (DRC) - Enhanced P-Type Behavior in 2D WSe2 via Chemical Defect Engineering
Rai, Amritesh, Park, Jun Hong, Zhang, Chenxi, Kwak, Iljo, Wolf, Steven, Vishwanath, Suresh, Lin, Xinyu, Furdyna, Jacek, Xing, Huili Grace, Cho, Kyeongjae, Kummel, Andrew C., Banerjee, Sanjay K.Année:
2018
Langue:
english
DOI:
10.1109/DRC.2018.8442266
Fichier:
PDF, 5.28 MB
english, 2018