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Tunable X-ray speckle-based phase-contrast and dark-field imaging using the unified modulated pattern analysis approach
Zdora, M.-C., Thibault, P., Deyhle, H., Vila-Comamala, J., Rau, C., Zanette, I.Volume:
13
Langue:
english
Journal:
Journal of Instrumentation
DOI:
10.1088/1748-0221/13/05/C05005
Date:
May, 2018
Fichier:
PDF, 2.45 MB
english, 2018