[IEEE 2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES) - Gdynia, Poland (2018.6.21-2018.6.23)] 2018 25th International Conference "Mixed Design of Integrated Circuits and System" (MIXDES) - Investigation of Scaling and Temperature Effects in Total Ionizing Dose (TID) Experiments in 65 nm CMOS
Chevas, Loukas, Nikolaou, Aristeidis, Bucher, Matthias, Makris, Nikolaos, Papadopoulou, Alexia, Zografos, Apostolos, Borghello, Giulio, Koch, Henri D., Faccio, FedericoAnnée:
2018
DOI:
10.23919/MIXDES.2018.8436809
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PDF, 3.23 MB
2018
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