Radiation-tolerance analysis of I-gate n-MOSFET according to isolation oxide module in the CMOS bulk process
Lee, Minwoong, Cho, Seongik, Lee, Namho, Kim, JongyeolVolume:
200
Langue:
english
Journal:
Microelectronic Engineering
DOI:
10.1016/j.mee.2018.08.007
Date:
November, 2018
Fichier:
PDF, 2.49 MB
english, 2018