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In-situ SEM and optical microscopy testing for investigation of fatigue crack growth mechanism under overload
Zhang, Wei, Cai, Liang, Hénaff, G.Volume:
165
Année:
2018
Langue:
english
Journal:
MATEC Web of Conferences
DOI:
10.1051/matecconf/201816513013
Fichier:
PDF, 856 KB
english, 2018