[IEEE 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Singapore (2018.7.16-2018.7.19)] 2018 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Complex Random Telegraph Noise (RTN): What Do We Understand?
Wang, Runsheng, Guo, Shaofeng, Zhang, Zexuan, Zou, Jibin, Mao, Dongyuan, Huang, RuAnnée:
2018
Langue:
english
DOI:
10.1109/IPFA.2018.8452514
Fichier:
PDF, 2.04 MB
english, 2018
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