Real-time quality monitoring in debutanizer column with regression tree and ANFIS
Siddharth, Kumar, Pathak, Amey, Pani, Ajaya KumarLangue:
english
Journal:
Journal of Industrial Engineering International
DOI:
10.1007/s40092-018-0276-4
Date:
May, 2018
Fichier:
PDF, 2.12 MB
english, 2018