Hard X-ray Resonant Ptychography for Chemical Imaging at the Sensitivity Limit
Reinhardt, Juliane, Schropp, Andreas, Lyubomirskiy, Mikhail, Seyrich, Martin, Bruckner, Dennis, Keller, Thomas F., Vonk, Vedran, Volko, Sergey, Stierle, Andreas, Navickas, Edvinas, Fleig, Jürgen., SchVolume:
24
Langue:
english
Journal:
Microscopy and Microanalysis
DOI:
10.1017/s1431927618012564
Date:
August, 2018
Fichier:
PDF, 1.88 MB
english, 2018