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Thickness effects on the microstructure and electrical/thermoelectric properties of co-evaporated Bi-Te thin films
Shen, Haishan, Lee, Suhyeon, Kang, Jun-gu, Eom, Tae-Yil, Lee, Hoojeong, Kang, Chiwon, Han, SeungwooVolume:
767
Langue:
english
Journal:
Journal of Alloys and Compounds
DOI:
10.1016/j.jallcom.2018.07.125
Date:
October, 2018
Fichier:
PDF, 1.34 MB
english, 2018