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Barrier height control in metal/silicon contacts with atomically thin MoS2 and WS2 interfacial layers
Nam, Seung-Geol, Cho, Yeonchoo, Lee, Min-Hyun, Shin, Keun Wook, Kim, Changhyun, Yang, Kiyeon, Jeong, Myoungho, Shin, Hyeon-Jin, Park, SeongjunLangue:
english
Journal:
2D Materials
DOI:
10.1088/2053-1583/aad794
Date:
August, 2018
Fichier:
PDF, 944 KB
english, 2018