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Defect Detection in Textures through the Use of Entropy as a Means for Automatically Selecting the Wavelet Decomposition Level
Navarro, Pedro, Fernández-Isla, Carlos, Alcover, Pedro, Suardíaz, JuanVolume:
16
Langue:
english
Journal:
Sensors
DOI:
10.3390/s16081178
Date:
July, 2016
Fichier:
PDF, 3.08 MB
english, 2016