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Interferometric synthetic aperture microscopy for extended focus optical coherence microscopy
Coquoz, Séverine, Bouwens, Arno, Marchand, Paul J., Extermann, Jérôme, Lasser, TheoVolume:
25
Langue:
english
Journal:
Optics Express
DOI:
10.1364/oe.25.030807
Date:
November, 2017
Fichier:
PDF, 5.44 MB
english, 2017