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Reliability Testing and Stress Measurement of QFN Packages Encapsulated by an Open-ended Microwave Curing System
Adamietz, Raphael, Desmulliez, Marc P. Y., Pavuluri, Sumanth K., Tilford, Tim, Bailey, Chris, Schreier-Alt, Thomas, Warmuth, JensAnnée:
2018
Langue:
english
Journal:
IEEE Transactions on Components, Packaging and Manufacturing Technology
DOI:
10.1109/TCPMT.2018.2859031
Fichier:
PDF, 2.74 MB
english, 2018