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Investigation of flux dependent sensitivity on single event effect in memory devices
Luo, Jie, Wang, Tie-shan, Li, Dong-qing, Liu, Tian-qi, Hou, Ming-dong, Sun, You-mei, Duan, Jing-lai, Yao, Hui-jun, Xi, Kai, Ye, Bing, Liu, JieVolume:
27
Langue:
english
Journal:
Chinese Physics B
DOI:
10.1088/1674-1056/27/7/076101
Date:
July, 2018
Fichier:
PDF, 1.31 MB
english, 2018